NE1617A
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?NXP B.V. 2012. All rights reserved.
Product data sheet
Rev. 5  20 March 2012
19 of 30
NXP Semiconductors
NE1617A
Temperature monitor for microprocessor systems
 
[1]   Specifications from -40 癈 to +125 癈 are guaranteed by design, not production tested.
[2]   Guaranteed but not 100 % tested.
[3]   Quantization error is not included in specifications for temperature accuracy. For example, if the NE1617A device temperature is exactly
+66.7 癈, the ADC may report +66 癈, +67 癈 or +68 癈 (due to the quantization error plus the -0.5 癈 offset used for rounding up) and
still be within the guaranteed ? 癈 error limits for the +60 癈 to +100 癈 temperature range.
[4]   T
remote
 is the junction temperature of the remote diode. See Section 7.1 
Temperature measurement

 for remote diode forward voltage
requirements.
Table 14.   Characteristics
V
DD
= 3.3 V; T
amb
= -40 ?/SPAN>C to +125 ?/SPAN>C; unless otherwise specified.
[1]
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
ADC and power supply
T
res
temperature resolution
monotonicity guaranteed
[2]
8
-
-
bits
T
acc(loc)
local temperature accuracy
[3]
T
amb
= +60 癈 to +100 癈
-
< ?
?
T
amb
= -40 癈 to +125 癈
-
< ?
?
T
acc(rem)
remote temperature
accuracy
[3]
T
remote
= +60 癈 to +100 癈
[4]
-
-
?
T
remote
= -40 癈 to +125 癈
[4]
-
-
?
V
DD
supply voltage
3.0
-
5.5
V
t
conv
conversion time
from STOP bit to conversion
complete; both channels
-
125
156
ms
E
f(conv)
conversion rate error
percentage error in programmed
rate
-25
-
+25
%
SMBus interface
V
IH
HIGH-level input voltage
STBY
, SCLK, SDATA
V
DD
= 3 V
2.2
-
-
V
V
DD
= 5.5 V
2.4
-
-
V
V
IL
LOW-level input voltage
STBY
, SCLK, SDATA;
V
DD
= 3 V to 5.5 V
-
-
0.8
V
I
sink
sink current
logic output LOW;
ALERT
, SDATA forced to 0.4 V
6
-
-
mA
I
LOH
HIGH-level output leakage
current
ALERT
; forced to 5.5 V
-
-
1
mA
I
I
input current
logic inputs forced to V
DD
 or GND
-2
-
+2
mA
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